A new technique to characterize the second-order response of thin films of low symmetry

  • Mikael Tuomas Siltanen (Speaker)

    Activity: Talk or presentationConference presentation

    Period2003
    Event titleNorthern Optics 2003, 16-18 June 2003, Espoo
    Event typeConference

    Country of activity

    • United States

    Publication forum classification

    • No publication forum level