Transmission Electron Microscopy Characterisation of Semiconductor Materials

  • Jaakko-Tuomas Keränen (Speaker)

    Activity: Talk or presentation › Conference presentation

    Period1999
    Event titleThe Microscopy User Meeting, Centre for Materials Science, Department of Physics, University of Oslo, Norway, 13 October 1999
    Event typeConference

    Country of activity

    • Norway

    Publication forum classification

    • No publication forum level