Tampere Microscopy Center

Facility/equipment: Facility

  • Location

    Korkeakoulunkatu 3

    Sähkötalo, 1. Floor E-wing (Door SE105D)

    Tampere

    33720

    Finland

Equipments Details

Description

Facility to analyse the microstructure and chemical composition of materials down to the atomic scale. Center offers versatile selection of instruments for material characterization.

EQUIPMENT:
Analytical (scanning) transmission electron microscope (Jeol F200 S/TEM) with EDS (Jeol dual EDS for F200) and EELS (Gatan Continuum), analytical high resolution scanning electron microscope (Zeiss UltraPlus FESEM) with EDS (Oxford Instruments XMaxN) and EBSD (Oxford Instruments Symmetry), focused ion beam microscope (Zeiss Crossbeam 540 FIBSEM) with EDS (Oxford Instruments XMaxN), basic scanning electron microscopes with low vacuum mode and EDSs (Tescan Vega SEM + Bruker EDS, Jeol IT-500 SEM+ Jeol EDS), FESEM (Zeiss Ultra 55) with e-beam lithography (Raith), Raman microscope (Renishaw InVia Qontor), micro X-ray fluorescence spectrometer (Bruker M4 Tornado Plus XRF), versatile atomic force microscope (Bruker Icon AFM), and comprehensive sample preparation equipment for electron microscopy samples.
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Keywords

  • Q Science (General)
  • microscopy
  • TEM
  • SEM
  • Raman
  • µXRF
  • EDS
  • EBSD
  • AFM
  • FIB

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