Tampere Microscopy Center

Facility/equipment: Facility

  • Location

    Finland

Equipments Details

Description

Facility to analyse the microstructure and chemical composition of materials down to the atomic scale. Center offers versatile selection of instruments for material characterization.

Equipment
Analytical transmission electron microscope (Jeol F200 S/TEM) with EDS and EELS, analytical high resolution scanning electron microscope (Zeiss UltraPlus FE-SEM) with EDS and EBSD, focused ion beam microscope FIB-SEM (Zeiss Crossbeam 540) with EDS, basic scanning electron microscopes with EDS (Tescan Vega, Jeol IT-500), FE-SEM electron microscope with Raith e-beam lithography, Raman microscope (Renishaw InVia Qontor), Micro X-ray fluorescence spectrometer (Bruker M4 Tornado Plus), and versatile sample preparation equipment for EM samples
Photo associated with equipment

Keywords

  • Q Science (General)
  • microscopy
  • TEM
  • SEM
  • Raman
  • µXRF

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