| Original language | English |
|---|---|
| Publication status | Published - 1994 |
| Publication type | D4 Published development or research report or study |
Publication series
| Name | Tampereen yliopisto, Matemaattisten tieteiden laitos. Sarja A |
|---|---|
| No. | 292 |
A goodness-of-fit test based on binary data
Yang Zhen-Hai, Erkki P. Liski
Research output: Book/Report › Commissioned report