A quantitative structural characterisation of active semiconducting materials (mSi; SiO2; Al2O3; TiO2) for use in printed electronics using a combination of Small Angle Light Scattering (SALS) and Ultra Small Angle X-ray Scattering (USAXS)

  • Rhyme Setshedi*
  • , Serges Zambou
  • , Emmanuel O. Jonah
  • , Batsirai Magunje
  • , David M. Unuigbe
  • , David T. Britton
  • , Margit Harting
  • , Michael Ekonde Sone
    • *Corresponding author for this work

Research output: Contribution to journal › Article › Scientific › peer-review

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