A technique to assess the reliability of the second-order susceptibility determination of thin films

M. Siltanen, M. Kauranen

    Research output: Contribution to journalArticleScientificpeer-review

    6 Citations (Scopus)
    Translated title of the contributionA technique to assess the reliability of the second-order susceptibility determination of thin films
    Original languageEnglish
    Pages (from-to)359-367
    JournalOptics Communications
    Issue number261
    DOIs
    Publication statusPublished - 2006
    Publication typeA1 Journal article-refereed

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