Accelerated testing for failures of tantalum capacitors

Johanna Virkki, Timo Seppälä, Laura Frisk, Pekka Heino

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16 Citations (Scopus)

Translated title of the contribution	Accelerated testing for failures of tantalum capacitors
Original language	English
Pages (from-to)	217-219
Journal	Microelectronics Reliability
Volume	50
Issue number	2
DOIs	https://doi.org/10.1016/j.microrel.2009.11.006
Publication status	Published - 2010
Publication type	A1 Journal article-refereed

Publication forum classification

@article{f7ad2c3fb9464bc6b1641ee944e95d47,

title = "Accelerated testing for failures of tantalum capacitors",

author = "Johanna Virkki and Timo Sepp{\"a}l{\"a} and Laura Frisk and Pekka Heino",

note = "Contribution: organisation=ele rr,FACT1=1",

year = "2010",

doi = "10.1016/j.microrel.2009.11.006",

language = "English",

volume = "50",

pages = "217--219",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier",

number = "2",

}

TY - JOUR

T1 - Accelerated testing for failures of tantalum capacitors

AU - Virkki, Johanna

AU - Seppälä, Timo

AU - Frisk, Laura

AU - Heino, Pekka

N1 - Contribution: organisation=ele rr,FACT1=1

PY - 2010

Y1 - 2010

U2 - 10.1016/j.microrel.2009.11.006

DO - 10.1016/j.microrel.2009.11.006

M3 - Article

SN - 0026-2714

VL - 50

SP - 217

EP - 219

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 2

ER -