AFM tip characterization by Kelvin probe force microscopy

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Translated title of the contribution	AFM tip characterization by Kelvin probe force microscopy
Original language	English
Pages (from-to)	1-14
Number of pages	14
Journal	New Journal of Physics
Volume	12
Issue number	093024
DOIs	https://doi.org/10.1088/1367-2630/12/9/093024
Publication status	Published - 2010
Publication type	A1 Journal article-refereed

Publication forum classification

@article{020ba48ec446409aa33e409a8fbbc07b,

title = "AFM tip characterization by Kelvin probe force microscopy",

author = "C. Barth and Teemu Hynninen and M. Bieletzki and C.R. Henry and Foster, \{Adam S.\} and F. Esch and U. Heiz",

note = "Contribution: organisation=fys,FACT1=1",

year = "2010",

doi = "10.1088/1367-2630/12/9/093024",

language = "English",

volume = "12",

pages = "1--14",

journal = "New Journal of Physics",

issn = "1367-2630",

publisher = "Institute of Physics",

number = "093024",

}

TY - JOUR

T1 - AFM tip characterization by Kelvin probe force microscopy

AU - Barth, C.

AU - Hynninen, Teemu

AU - Bieletzki, M.

AU - Henry, C.R.

AU - Foster, Adam S.

AU - Esch, F.

AU - Heiz, U.

N1 - Contribution: organisation=fys,FACT1=1

PY - 2010

Y1 - 2010

U2 - 10.1088/1367-2630/12/9/093024

DO - 10.1088/1367-2630/12/9/093024

M3 - Article

SN - 1367-2630

VL - 12

SP - 1

EP - 14

JO - New Journal of Physics

JF - New Journal of Physics

IS - 093024

ER -