An expandable image database for evaluation of full-reference image visual quality metrics

Mykola Ponomarenko, Oleg Ieremeiev, Vladimir Lukin, Karen Egiazarian

Research output: Contribution to journalConference articleScientificpeer-review

2 Citations (Scopus)


Traditional approach to collect mean opinion score (MOS) values for evaluation of full-reference image quality metrics has two serious drawbacks. The first drawback is a nonlinearity of MOS, only partially compensated by the use of rank order correlation coefficients in a further analysis. The second drawback are limitations on number of distortion types and distortion levels in image database imposed by a maximum allowed time to carry out an experiment. One of the largest of databases used for this purpose, TID2013, has almost reached these limitations, which makes an extension of TID2013 within the boundaries of this approach to be practically unfeasible. In this paper, a novel methodology to collect MOS values, with a possibility to infinitely increase a size of a database by adding new types of distortions, is proposed. For the proposed methodology, MOS values are collected for pairs of distortions, one of them being a signal dependent Gaussian noise. A technique of effective linearization and normalization of MOS is described. Extensive experiments for linearization of MOS values to extend TID2013 database are carried out.

Original languageEnglish
JournalIS and T International Symposium on Electronic Imaging Science and Technology
Issue number10
Publication statusPublished - 26 Jan 2020
Publication typeA1 Journal article-refereed
EventImage Processing: Algorithms and Systems -
Duration: 26 Jan 202030 Jan 2020


  • Full-reference image visual quality metrics
  • Human visual perception
  • Image visual quality assessment

Publication forum classification

  • Publication forum level 1

ASJC Scopus subject areas

  • Computer Graphics and Computer-Aided Design
  • Computer Science Applications
  • Human-Computer Interaction
  • Software
  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics


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