An X-Ray Diffraction Study of the Effect of Rapid Thermal Annealing on GaAs Layers on Si Substrates

J. Varrio, F. Riesz, J. Lammasniemi, M. Hovinen, M. Pessa

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    4 Citations (Scopus)
    Translated title of the contributionAn X-Ray Diffraction Study of the Effect of Rapid Thermal Annealing on GaAs Layers on Si Substrates
    Original languageEnglish
    Pages (from-to)1-49
    Number of pages49
    JournalMaterials Letters
    Volume10
    Publication statusPublished - 1990
    Publication typeA1 Journal article-refereed

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