Assessing and Mitigating the Risk of Critical Knowledge Loss in Organizations: Insights from COVID-19 and the Great Resignation

Murray E. Jennex, Alexandra Durcikova, Ilona Ilvonen, Jeffry Babb

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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Abstract

This study addresses the challenges of knowledge loss and employee turnover caused by the COVID-19 pandemic. Retaining critical knowledge is essential for organizational success, but remote work and the "Great Resignation" have disrupted knowledge sharing. The goal of this research is to modify Jennex's (2014) knowledge loss risk model to accommodate these changes. By reviewing literature on the "Great Resignation" and previous studies on knowledge loss, hypotheses for new contributing factors are proposed. A survey was conducted to investigate these factors, revealing four significant influences on employee departure: the absence of remote work or flexible hours, provision of equipment and technical support for remote work, preference for flexible hours based on household size, and the need for high-speed internet for remote work. These findings will be incorporated into the Jennex knowledge loss risk predictor model.
Original languageEnglish
Title of host publicationProceedings of the 57th Hawaii International Conference on System Sciences
EditorsTung X. Bui
PublisherHawaii International Conference on System Sciences
Pages5522-5531
ISBN (Electronic)978-0-9981331-7-1
DOIs
Publication statusPublished - 2024
Publication typeA4 Article in conference proceedings
EventHawaii International Conference on System Sciences - Honolulu, United States
Duration: 3 Jan 20246 Jan 2024
Conference number: 57

Publication series

NameProceedings of the annual Hawaii international conference on system sciences
ISSN (Electronic)2572-6862

Conference

ConferenceHawaii International Conference on System Sciences
Abbreviated titleHICCS
Country/TerritoryUnited States
CityHonolulu
Period3/01/246/01/24

Publication forum classification

  • Publication forum level 1

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