Assessment of radiation exposure in dental cone-beam computerized tomography with the use of metal-oxide semiconductor field-effect transistor (MOSFET) dosimeters and Monte Carlo simulations

J Koivisto; T Kiljunen; M Tapiovaara; J Wolff; M Kortesniemi

doi:10.1016/j.oooo.2012.06.003

Assessment of radiation exposure in dental cone-beam computerized tomography with the use of metal-oxide semiconductor field-effect transistor (MOSFET) dosimeters and Monte Carlo simulations

J Koivisto
, T Kiljunen
, M Tapiovaara
, J Wolff
, M Kortesniemi

Research output: Contribution to journal › Article › Scientific › peer-review

45 Citations (Scopus)

Original language	English
Pages (from-to)	393-400
Journal	Oral Surgery Oral Medicine Oral Pathology Oral Radiology
Volume	114
Issue number	3
DOIs	https://doi.org/10.1016/j.oooo.2012.06.003
Publication status	Published - 2012
Publication type	A1 Journal article-refereed

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10.1016/j.oooo.2012.06.003

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Koivisto, J., Kiljunen, T., Tapiovaara, M., Wolff, J., & Kortesniemi, M. (2012). Assessment of radiation exposure in dental cone-beam computerized tomography with the use of metal-oxide semiconductor field-effect transistor (MOSFET) dosimeters and Monte Carlo simulations. Oral Surgery Oral Medicine Oral Pathology Oral Radiology, 114(3), 393-400. https://doi.org/10.1016/j.oooo.2012.06.003

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title = "Assessment of radiation exposure in dental cone-beam computerized tomography with the use of metal-oxide semiconductor field-effect transistor (MOSFET) dosimeters and Monte Carlo simulations",

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Koivisto, J, Kiljunen, T, Tapiovaara, M, Wolff, J & Kortesniemi, M 2012, 'Assessment of radiation exposure in dental cone-beam computerized tomography with the use of metal-oxide semiconductor field-effect transistor (MOSFET) dosimeters and Monte Carlo simulations', Oral Surgery Oral Medicine Oral Pathology Oral Radiology, vol. 114, no. 3, pp. 393-400. https://doi.org/10.1016/j.oooo.2012.06.003

Assessment of radiation exposure in dental cone-beam computerized tomography with the use of metal-oxide semiconductor field-effect transistor (MOSFET) dosimeters and Monte Carlo simulations. / Koivisto, J; Kiljunen, T; Tapiovaara, M et al.
In: Oral Surgery Oral Medicine Oral Pathology Oral Radiology, Vol. 114, No. 3, 2012, p. 393-400.

Research output: Contribution to journal › Article › Scientific › peer-review

TY - JOUR

T1 - Assessment of radiation exposure in dental cone-beam computerized tomography with the use of metal-oxide semiconductor field-effect transistor (MOSFET) dosimeters and Monte Carlo simulations

AU - Koivisto, J

AU - Kiljunen, T

AU - Tapiovaara, M

AU - Wolff, J

AU - Kortesniemi, M

PY - 2012

Y1 - 2012

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DO - 10.1016/j.oooo.2012.06.003

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