Abstract
Cathodoluminescence mapping is used as a contactless method to probe the electron concentration gradient of Te-doped GaAs nanowires. The room temperature and low temperature (10 K) cathodoluminescence analysis method previously developed for GaAs:Si is first validated on five GaAs:Te thin film samples, before extending it to the two GaAs:Te NW samples. We evidence an electron concentration gradient ranging from below 1 × 1018cm-3to 3.3 ×1018cm-3along the axis of a GaAs:Te nanowire grown at 640 °C, and a homogeneous electron concentration of around 6-8 × 1017cm-3along the axis of a GaAs:Te nanowire grown at 620 °C. The differences in the electron concentration levels and gradients between the two nanowires is attributed to different Te incorporation efficiencies by vapor-solid and vapor-liquid-solid processes.
Original language | English |
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Number of pages | 13 |
Journal | Nanotechnology |
Volume | 33 |
Issue number | 18 |
DOIs | |
Publication status | Published - 10 Feb 2022 |
Publication type | A1 Journal article-refereed |
Keywords
- cathodoluminescence
- doping
- electron concentrations
- GaAs
- MBE
- nanowires
Publication forum classification
- Publication forum level 2
ASJC Scopus subject areas
- Bioengineering
- General Chemistry
- General Materials Science
- Mechanics of Materials
- Mechanical Engineering
- Electrical and Electronic Engineering