Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction

A. Zolotaryov, A. Schramm, C. Heyn, A. Zozulya, W. Hansen

Research output: Contribution to journal › Article › Scientific › peer-review

1 Citation (Scopus)

Translated title of the contribution	Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction
Original language	English
Pages (from-to)	75-81
Journal	Materials Science in Semiconductor Processing
Volume	12
Issue number	1-2, Spec.Issue
DOIs	https://doi.org/10.1016/j.mssp.2009.07.009
Publication status	Published - 2009
Externally published	Yes
Publication type	A1 Journal article-refereed

Publication forum classification

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title = "Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction",

author = "A. Zolotaryov and A. Schramm and C. Heyn and A. Zozulya and W. Hansen",

note = "Contribution: organisation=orc,FACT1=1",

year = "2009",

doi = "10.1016/j.mssp.2009.07.009",

language = "English",

volume = "12",

pages = "75--81",

journal = "Materials Science in Semiconductor Processing",

issn = "1369-8001",

publisher = "Elsevier Limited",

number = "1-2, Spec.Issue",

}

TY - JOUR

T1 - Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction

AU - Zolotaryov, A.

AU - Schramm, A.

AU - Heyn, C.

AU - Zozulya, A.

AU - Hansen, W.

N1 - Contribution: organisation=orc,FACT1=1

PY - 2009

Y1 - 2009

U2 - 10.1016/j.mssp.2009.07.009

DO - 10.1016/j.mssp.2009.07.009

M3 - Article

SN - 1369-8001

VL - 12

SP - 75

EP - 81

JO - Materials Science in Semiconductor Processing

JF - Materials Science in Semiconductor Processing

IS - 1-2, Spec.Issue

ER -