@inproceedings{5fd54337f4fe46b2b403ff01bbfd8e3b,
title = "Characterizing leakage current in silicon nanowire-based field-effect transistors by applying pseudo-random sequences",
author = "Tomi Roinila and Xiao Yu and Anran Gao and Tie Li and Jarmo Verho and Matti Vilkko and Pasi Kallio and Yuelin Wang and Jukka Lekkala",
note = "Contribution: organisation=ase aci,FACT1=1<br/>Publisher name: Changchun University of Science and Technology",
year = "2012",
language = "English",
isbn = "978-1-4673-4588-0",
series = "International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale",
publisher = "Changchun University of Science and Technology",
pages = "1--5",
booktitle = "Proceedings of Second International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 29 Aug. - 1 Sept. 2012, Xi'an, China",
}