Charged cable-system ESD event

Pasi Tamminen; Toni Viheriäkoski

doi:10.1109/EOSESD.2016.7592559

Charged cable-system ESD event

Pasi Tamminen
, Toni Viheriäkoski

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

5 Citations (Scopus)

Abstract

A charged electronic system failed while it was connected to a USB port. The resulting discharge current waveform had a sub-nanosecond initial peak that bypassed on-board protection devices. In this study the ESD stress waveform is analyzed with simulation and measurement methods.

Original language	English
Title of host publication	2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)
Publisher	IEEE
ISBN (Electronic)	978-1-5853-7289-8
DOIs	https://doi.org/10.1109/EOSESD.2016.7592559
Publication status	Published - 18 Oct 2016
Publication type	A4 Article in conference proceedings
Event	Electrical Overstress/Electrostatic Discharge Symposium - Duration: 1 Jan 1900 → …

Conference

Conference	Electrical Overstress/Electrostatic Discharge Symposium
Period	1/01/00 → …

Keywords

cable shielding
cables (electric)
electromagnetic shielding
electrostatic discharge
peripheral interfaces
ESD stress waveform
USB port
charged cable system ESD event
charged electronic system
discharge current waveform
on-board protection devices
subnanosecond initial peak
Cable TV
Cable shielding
Current measurement
Discharges (electric)
Power cables
Universal Serial Bus
Wires

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10.1109/EOSESD.2016.7592559

Cite this

@inproceedings{1b40c764e17e4905ab3965baf8705fb8,

title = "Charged cable-system ESD event",

abstract = "A charged electronic system failed while it was connected to a USB port. The resulting discharge current waveform had a sub-nanosecond initial peak that bypassed on-board protection devices. In this study the ESD stress waveform is analyzed with simulation and measurement methods.",

keywords = "cable shielding, cables (electric), electromagnetic shielding, electrostatic discharge, peripheral interfaces, ESD stress waveform, USB port, charged cable system ESD event, charged electronic system, discharge current waveform, on-board protection devices, subnanosecond initial peak, Cable TV, Cable shielding, Current measurement, Discharges (electric), Power cables, Universal Serial Bus, Wires",

author = "Pasi Tamminen and Toni Viheri{\"a}koski",

year = "2016",

month = oct,

day = "18",

doi = "10.1109/EOSESD.2016.7592559",

language = "English",

booktitle = "2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)",

publisher = "IEEE",

address = "United States",

note = "Electrical Overstress/Electrostatic Discharge Symposium ; Conference date: 01-01-1900",

}

TY - GEN

T1 - Charged cable-system ESD event

AU - Tamminen, Pasi

AU - Viheriäkoski, Toni

PY - 2016/10/18

Y1 - 2016/10/18

N2 - A charged electronic system failed while it was connected to a USB port. The resulting discharge current waveform had a sub-nanosecond initial peak that bypassed on-board protection devices. In this study the ESD stress waveform is analyzed with simulation and measurement methods.

AB - A charged electronic system failed while it was connected to a USB port. The resulting discharge current waveform had a sub-nanosecond initial peak that bypassed on-board protection devices. In this study the ESD stress waveform is analyzed with simulation and measurement methods.

KW - cable shielding

KW - cables (electric)

KW - electromagnetic shielding

KW - electrostatic discharge

KW - peripheral interfaces

KW - ESD stress waveform

KW - USB port

KW - charged cable system ESD event

KW - charged electronic system

KW - discharge current waveform

KW - on-board protection devices

KW - subnanosecond initial peak

KW - Cable TV

KW - Cable shielding

KW - Current measurement

KW - Discharges (electric)

KW - Power cables

KW - Universal Serial Bus

KW - Wires

U2 - 10.1109/EOSESD.2016.7592559

DO - 10.1109/EOSESD.2016.7592559

M3 - Conference contribution

BT - 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

PB - IEEE

T2 - Electrical Overstress/Electrostatic Discharge Symposium

Y2 - 1 January 1900

ER -

Charged cable-system ESD event

Abstract

Conference

Keywords

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