Classification method for defect images based on association and clustering

I. Kunttu, L. Lepistö, J. Rauhamaa, A. Visa

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    3 Citations (Scopus)
    Translated title of the contributionClassification method for defect images based on association and clustering
    Original languageEnglish
    Title of host publicationProceedings of SPIE Data Mining and Knowledge Discovery: Theory, Tools, and Technology V, Orlando, Florida, USA, 21-22 April 2003
    EditorsB. V. Dasarathy
    PublisherSPIE
    Pages19-27
    Publication statusPublished - 2003
    Publication typeA4 Article in a conference publication
    EventSPIE CONFERENCE PROCEEDINGS -
    Duration: 1 Jan 1900 → …

    Conference

    ConferenceSPIE CONFERENCE PROCEEDINGS
    Period1/01/00 → …

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