Classification method for defect images based on association and clustering

I. Kunttu; L. Lepistö; J. Rauhamaa; A. Visa

Classification method for defect images based on association and clustering

I. Kunttu, L. Lepistö, J. Rauhamaa, A. Visa

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Translated title of the contribution	Classification method for defect images based on association and clustering
Original language	English
Title of host publication	Proceedings of SPIE Data Mining and Knowledge Discovery: Theory, Tools, and Technology V, Orlando, Florida, USA, 21-22 April 2003
Editors	B. V. Dasarathy
Publisher	SPIE
Pages	19-27
Publication status	Published - 2003
Publication type	A4 Article in a conference publication
Event	SPIE CONFERENCE PROCEEDINGS - Duration: 1 Jan 1900 → …

Conference

Conference	SPIE CONFERENCE PROCEEDINGS
Period	1/01/00 → …

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No publication forum level

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http://www.spie.org

Cite this

@inproceedings{d4328ef07687451b99dfaecdcd0eacce,

title = "Classification method for defect images based on association and clustering",

author = "I. Kunttu and L. Lepist{\"o} and J. Rauhamaa and A. Visa",

note = "ISBN 0-8194-4958-X, ISSN 0277-786X<br/>Contribution: organisation=sgn,FACT1=1; SPIE CONFERENCE PROCEEDINGS ; Conference date: 01-01-1900",

year = "2003",

language = "English",

pages = "19--27",

editor = "Dasarathy, {B. V.}",

booktitle = "Proceedings of SPIE Data Mining and Knowledge Discovery: Theory, Tools, and Technology V, Orlando, Florida, USA, 21-22 April 2003",

publisher = "SPIE",

address = "United States",

}

Classification method for defect images based on association and clustering. / Kunttu, I.; Lepistö, L.; Rauhamaa, J.; Visa, A.

Proceedings of SPIE Data Mining and Knowledge Discovery: Theory, Tools, and Technology V, Orlando, Florida, USA, 21-22 April 2003. ed. / B. V. Dasarathy. SPIE, 2003. p. 19-27.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Classification method for defect images based on association and clustering

AU - Kunttu, I.

AU - Lepistö, L.

AU - Rauhamaa, J.

AU - Visa, A.

N1 - ISBN 0-8194-4958-X, ISSN 0277-786X<br/>Contribution: organisation=sgn,FACT1=1

PY - 2003

Y1 - 2003

M3 - Conference contribution

SP - 19

EP - 27

BT - Proceedings of SPIE Data Mining and Knowledge Discovery: Theory, Tools, and Technology V, Orlando, Florida, USA, 21-22 April 2003

A2 - Dasarathy, B. V.

PB - SPIE

T2 - SPIE CONFERENCE PROCEEDINGS

Y2 - 1 January 1900

ER -