| Original language | English |
|---|---|
| Pages (from-to) | 2856-2860 |
| Journal | Journal of Applied Physics |
| Volume | 61 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - 1987 |
| Externally published | Yes |
| Publication type | A1 Journal article-refereed |
Comparative study of the growth processes of GaAs, AlGaAs, InGaAs, and InAlAs lattice matched and nonlattice matched semiconductors using high-energy electron diffraction
P.R. Berger, P.K. Bhattacharya, J. Singh
Research output: Contribution to journal › Article › Scientific › peer-review
33
Citations
(Scopus)