Correlation of component human body model and charged device model qualification levels with electrical failures in electronics assembly

Pasi Tamminen, Leena Ukkonen, Lauri Sydänheimo

    Research output: Contribution to journalArticleScientificpeer-review

    12 Citations (Scopus)

    Abstract

    Electrostatic discharge sensitivity of integrated circuits is compared with electrical failure levels in electronics assembly. Electrical components with a low electrostatic discharge withstand voltage would be expected to have more electrical failures than more robust components. However, the analysis based on 47 products, 14 facilities, and 6 billion integrated circuits show no correlation between electrical failures and electrostatic discharge sensitivity of components. This was found when the withstand voltage of the components is equal or higher than 100 V human body model and 200 V charged device model. (c) 2015 Elsevier B.V. All rights reserved.

    Original languageEnglish
    Pages (from-to)38-44
    Number of pages7
    JournalJournal of Electrostatics
    Volume79
    DOIs
    Publication statusPublished - Feb 2016
    Publication typeA1 Journal article-refereed

    Keywords

    • ESD
    • HBM
    • CDM
    • Electrical failures
    • Assembly

    Publication forum classification

    • Publication forum level 1

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