Dependence of the anisotropy of wet chemical etching of silicon on the amount of surface coverage by OH radicals

M.A. Gosalvez, A.S. Foster, R.M. Nieminen

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)
Translated title of the contributionDependence of the anisotropy of wet chemical etching of silicon on the amount of surface coverage by OH radicals
Original languageEnglish
Pages (from-to)53-65
JournalSensors and Materials
Volume15
Issue number2
Publication statusPublished - 2003
Externally publishedYes
Publication typeA1 Journal article-refereed

Publication forum classification

  • Publication forum level 1

Cite this