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Depth profiles of defects in CdTe (100) overlayers grown by molecular beam epitaxy on GaAs(100)

  • E. Rauhala
  • , J. Keinonen
  • , K. Rakennus
  • , M. Pessa

    Research output: Contribution to journalArticleScientificpeer-review

    23 Citations (Scopus)
    Translated title of the contributionDepth profiles of defects in CdTe (100) overlayers grown by molecular beam epitaxy on GaAs(100)
    Original languageEnglish
    Pages (from-to)973-974
    JournalApplied Physics Letters
    Volume51
    Issue number13
    Publication statusPublished - 1987
    Publication typeA1 Journal article-refereed

    Publication forum classification

    • Publication forum level 2

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