Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2(110) surface

G.H. Enevoldsen; H.P. Pinto; A.S. Foster; M.C.R. Jensen; A. Kuehnle; M. Reichling; W.A Hofer; J.V. Lauritsen; F. Besenbacher

doi:10.1103/PhysRevB.78.045416

Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2(110) surface

G.H. Enevoldsen, H.P. Pinto, A.S. Foster, M.C.R. Jensen, A. Kuehnle, M. Reichling, W.A Hofer, J.V. Lauritsen, F. Besenbacher

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Translated title of the contribution	Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2(110) surface
Original language	English
Pages (from-to)	19 p
Journal	Physical Review B
Volume	78
Issue number	4, 045416
DOIs	https://doi.org/10.1103/PhysRevB.78.045416
Publication status	Published - 2008
Externally published	Yes
Publication type	A1 Journal article-refereed

Publication forum classification

Publication forum level 2

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10.1103/PhysRevB.78.045416

Cite this

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title = "Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2(110) surface",

author = "G.H. Enevoldsen and H.P. Pinto and A.S. Foster and M.C.R. Jensen and A. Kuehnle and M. Reichling and W.A Hofer and J.V. Lauritsen and F. Besenbacher",

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AU - Enevoldsen, G.H.

AU - Pinto, H.P.

AU - Foster, A.S.

AU - Jensen, M.C.R.

AU - Kuehnle, A.

AU - Reichling, M.

AU - Hofer, W.A

AU - Lauritsen, J.V.

AU - Besenbacher, F.

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PY - 2008

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U2 - 10.1103/PhysRevB.78.045416

DO - 10.1103/PhysRevB.78.045416

M3 - Article

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SP - 19 p

JO - Physical Review B

JF - Physical Review B

IS - 4, 045416

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