Determination of second-order susceptibility components of thin films by two-beam second-harmonic generation

S. Cattaneo; M. Kauranen

doi:10.1364/OL.28.001445

Determination of second-order susceptibility components of thin films by two-beam second-harmonic generation

S. Cattaneo
, M. Kauranen

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Abstract

We measure the susceptibility components of a poled polymer film by second-harmonic generation with two beams at the fundamental frequency. The technique allows the consistency of experimental data and the validity of the theoretical model used to analyze the results to be addressed. Our results are in agreement with the expected values, provided that the linear optical properties of the sample are properly included.

Translated title of the contribution	Determination of second-order susceptibility components of thin films by two-beam second-harmonic generation
Original language	English
Pages (from-to)	1445-1447
Journal	Optics Letters
Volume	28
Issue number	16
DOIs	https://doi.org/10.1364/OL.28.001445
Publication status	Published - 2003
Publication type	A1 Journal article-refereed

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10.1364/OL.28.001445

Cattaneo determination of second-order
This paper was published in Optics Letters and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-16-1445. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

http://urn.fi/URN:NBN:fi:tty-201103311120

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AB - We measure the susceptibility components of a poled polymer film by second-harmonic generation with two beams at the fundamental frequency. The technique allows the consistency of experimental data and the validity of the theoretical model used to analyze the results to be addressed. Our results are in agreement with the expected values, provided that the linear optical properties of the sample are properly included.

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DO - 10.1364/OL.28.001445

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Determination of second-order susceptibility components of thin films by two-beam second-harmonic generation

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