Development of a matrix test board for capacitor reliability testing

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Translated title of the contribution	Development of a matrix test board for capacitor reliability testing
Original language	English
Pages (from-to)	1711-1714
Journal	Microelectronics Reliability
Volume	50
Issue number	9-11
DOIs	https://doi.org/10.1016/j.microrel.2010.07.023
Publication status	Published - 2010
Publication type	A1 Journal article-refereed

Publication forum classification

@article{fe790689f32a4efea75cfdad92d2790c,

title = "Development of a matrix test board for capacitor reliability testing",

author = "Johanna Virkki and A. Koskenkorva and Laura Frisk",

note = "Contribution: organisation=ele rr,FACT1=1",

year = "2010",

doi = "10.1016/j.microrel.2010.07.023",

language = "English",

volume = "50",

pages = "1711--1714",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Limited",

number = "9-11",

}

TY - JOUR

T1 - Development of a matrix test board for capacitor reliability testing

AU - Virkki, Johanna

AU - Koskenkorva, A.

AU - Frisk, Laura

N1 - Contribution: organisation=ele rr,FACT1=1

PY - 2010

Y1 - 2010

U2 - 10.1016/j.microrel.2010.07.023

DO - 10.1016/j.microrel.2010.07.023

M3 - Article

SN - 0026-2714

VL - 50

SP - 1711

EP - 1714

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 9-11

ER -