Distinguishing between low symmetries when determining the nonlinearity of chiral thin films

M. Siltanen, S. Cattaneo, E. Vuorimaa, H. Lemmetyinen, K.E.S. Phillips, T.J. Katz, M. Kauranen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Translated title of the contributionDistinguishing between low symmetries when determining the nonlinearity of chiral thin films
    Original languageEnglish
    Title of host publicationLinear and Nonlinear Optics of Organic Materials V, 2-4 August 2005, San Diego, California, USA. Proceedings of SPIE
    EditorsM. Eich
    Pages9 p
    Publication statusPublished - 2005
    Publication typeA4 Article in conference proceedings

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