Dynamic scaling rules of real size paper finishing unit to laboratory environment

J.-M. Kivinen, V.-M. Järvenpää, E. Keskinen, M. Cotsaftis

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific

Translated title of the contribution	Dynamic scaling rules of real size paper finishing unit to laboratory environment
Original language	English
Title of host publication	Proceedings of ETCE/OMAE 2000 Joint Conference, Energy for the New Millenium, February 14-17, 2000, NEw Orleans, Louisiana
Place of Publication	USA
Publisher	ASME International
Pages	8 s
Publication status	Published - 2000
Publication type	B3 Article in conference proceedings

Publication forum classification

@inproceedings{ab44b54a409c484c82f51d607bdb2f61,

title = "Dynamic scaling rules of real size paper finishing unit to laboratory environment",

author = "J.-M. Kivinen and V.-M. J{\"a}rvenp{\"a}{\"a} and E. Keskinen and M. Cotsaftis",

note = "CD-ROM<br/>Contribution: organisation=ksu kdyn,FACT1=1",

year = "2000",

language = "English",

pages = "8 s",

booktitle = "Proceedings of ETCE/OMAE 2000 Joint Conference, Energy for the New Millenium, February 14-17, 2000, NEw Orleans, Louisiana",

publisher = "ASME International",

}

Dynamic scaling rules of real size paper finishing unit to laboratory environment. / Kivinen, J.-M.; Järvenpää, V.-M.; Keskinen, E. et al.
Proceedings of ETCE/OMAE 2000 Joint Conference, Energy for the New Millenium, February 14-17, 2000, NEw Orleans, Louisiana. USA: ASME International, 2000. p. 8 s.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific

TY - GEN

T1 - Dynamic scaling rules of real size paper finishing unit to laboratory environment

AU - Kivinen, J.-M.

AU - Järvenpää, V.-M.

AU - Keskinen, E.

AU - Cotsaftis, M.

N1 - CD-ROM<br/>Contribution: organisation=ksu kdyn,FACT1=1

PY - 2000

Y1 - 2000

M3 - Conference contribution

SP - 8 s

BT - Proceedings of ETCE/OMAE 2000 Joint Conference, Energy for the New Millenium, February 14-17, 2000, NEw Orleans, Louisiana

PB - ASME International

CY - USA

ER -