Effect of protective casting materials on product level reliability under accelerated test conditions

J. Pippola; T. Marttila; L. Frisk

Effect of protective casting materials on product level reliability under accelerated test conditions

J. Pippola, T. Marttila, L. Frisk

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Translated title of the contribution	Effect of protective casting materials on product level reliability under accelerated test conditions
Original language	English
Title of host publication	EMPC 2013, European Microelectronics Packaking Conference, 9-12 September 2013, Grenoble, France
Publisher	IEEE
Pages	1-6
Number of pages	6
ISBN (Print)	978-2-95-274671-7
Publication status	Published - 2013
Publication type	A4 Article in conference proceedings

Publication series

Name	European Microelectronics and Packaging Conference

Publication forum classification

Publication forum level 1

Access to Document

http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6698651

Cite this

Pippola, J., Marttila, T., & Frisk, L. (2013). Effect of protective casting materials on product level reliability under accelerated test conditions. In EMPC 2013, European Microelectronics Packaking Conference, 9-12 September 2013, Grenoble, France (pp. 1-6). (European Microelectronics and Packaging Conference). IEEE. http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6698651

@inproceedings{e3f84097907b4b4aa60c74d7f663ff59,

title = "Effect of protective casting materials on product level reliability under accelerated test conditions",

author = "J. Pippola and T. Marttila and L. Frisk",

note = "Contribution: organisation=dee,FACT1=1<br/>Portfolio EDEND: 2013-12-29<br/>Publisher name: Institute of Electrical and Electronics Engineers IEEE",

year = "2013",

language = "English",

isbn = "978-2-95-274671-7",

series = "European Microelectronics and Packaging Conference",

publisher = "IEEE",

pages = "1--6",

booktitle = "EMPC 2013, European Microelectronics Packaking Conference, 9-12 September 2013, Grenoble, France",

address = "United States",

}

Pippola, J, Marttila, T & Frisk, L 2013, Effect of protective casting materials on product level reliability under accelerated test conditions. in EMPC 2013, European Microelectronics Packaking Conference, 9-12 September 2013, Grenoble, France. European Microelectronics and Packaging Conference, IEEE, pp. 1-6. <http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6698651>

Effect of protective casting materials on product level reliability under accelerated test conditions. / Pippola, J.; Marttila, T.; Frisk, L.
EMPC 2013, European Microelectronics Packaking Conference, 9-12 September 2013, Grenoble, France. IEEE, 2013. p. 1-6 (European Microelectronics and Packaging Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Effect of protective casting materials on product level reliability under accelerated test conditions

AU - Pippola, J.

AU - Marttila, T.

AU - Frisk, L.

N1 - Contribution: organisation=dee,FACT1=1<br/>Portfolio EDEND: 2013-12-29<br/>Publisher name: Institute of Electrical and Electronics Engineers IEEE

PY - 2013

Y1 - 2013

M3 - Conference contribution

SN - 978-2-95-274671-7

T3 - European Microelectronics and Packaging Conference

SP - 1

EP - 6

BT - EMPC 2013, European Microelectronics Packaking Conference, 9-12 September 2013, Grenoble, France

PB - IEEE

ER -