Effects of different combinations of environmental tests on the reliability of UHF RFID tags

Laura Frisk, Kirsi Saarinen, Leena Ukkonen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

7 Citations (Scopus)

Translated title of the contribution	Effects of different combinations of environmental tests on the reliability of UHF RFID tags
Original language	English
Title of host publication	EMPC-2011 18th European Microelectronics & Packaging Conference, 12th-15th September 2011, Brighton, UK
Place of Publication	Piscataway, NJ
Publisher	IEEE
Pages	1-5
Number of pages	5
ISBN (Print)	978-1-4673-0694-2
Publication status	Published - 2011
Publication type	A4 Article in conference proceedings

Name	European Microelectronics & Packaging Conference EMPC
Publisher	IEEE

Publication forum classification

@inproceedings{961f0adf3bf44d9abedd118158ce8e9f,

title = "Effects of different combinations of environmental tests on the reliability of UHF RFID tags",

author = "Laura Frisk and Kirsi Saarinen and Leena Ukkonen",

note = "ei ut-numeroa 1.3.2014<br/>Contribution: organisation=ele,FACT1=1",

year = "2011",

language = "English",

isbn = "978-1-4673-0694-2",

series = "European Microelectronics & Packaging Conference EMPC",

publisher = "IEEE",

pages = "1--5",

booktitle = "EMPC-2011 18th European Microelectronics & Packaging Conference, 12th-15th September 2011, Brighton, UK",

address = "United States",

}

Effects of different combinations of environmental tests on the reliability of UHF RFID tags. / Frisk, Laura; Saarinen, Kirsi; Ukkonen, Leena.
EMPC-2011 18th European Microelectronics & Packaging Conference, 12th-15th September 2011, Brighton, UK. Piscataway, NJ: IEEE, 2011. p. 1-5 (European Microelectronics & Packaging Conference EMPC).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Effects of different combinations of environmental tests on the reliability of UHF RFID tags

AU - Frisk, Laura

AU - Saarinen, Kirsi

AU - Ukkonen, Leena

N1 - ei ut-numeroa 1.3.2014<br/>Contribution: organisation=ele,FACT1=1

PY - 2011

Y1 - 2011

M3 - Conference contribution

SN - 978-1-4673-0694-2

T3 - European Microelectronics & Packaging Conference EMPC

SP - 1

EP - 5

BT - EMPC-2011 18th European Microelectronics & Packaging Conference, 12th-15th September 2011, Brighton, UK

PB - IEEE

CY - Piscataway, NJ

ER -