Effects of different temperature cycling test profiles on the reliability of UHF RFID tags

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

5 Citations (Scopus)

Translated title of the contribution	Effects of different temperature cycling test profiles on the reliability of UHF RFID tags
Original language	English
Title of host publication	ESTC 2012. 4th Electronics System Integration Technologies Conference, September 17-20, 2012, Amsterdam, Netherlands
Pages	1-4
Number of pages	4
DOIs	https://doi.org/10.1109/ESTC.2012.6542202
Publication status	Published - 2012
Publication type	A4 Article in conference proceedings

Publication forum classification

@inproceedings{2184ef4cd3f841d18c5dae0d2529c694,

title = "Effects of different temperature cycling test profiles on the reliability of UHF RFID tags",

author = "Kirsi Saarinen and Laura Frisk",

note = "Contribution: organisation=ele,FACT1=1",

year = "2012",

doi = "10.1109/ESTC.2012.6542202",

language = "English",

isbn = "978-1-4673-4645-0",

pages = "1--4",

booktitle = "ESTC 2012. 4th Electronics System Integration Technologies Conference, September 17-20, 2012, Amsterdam, Netherlands",

}

Effects of different temperature cycling test profiles on the reliability of UHF RFID tags. / Saarinen, Kirsi; Frisk, Laura.
ESTC 2012. 4th Electronics System Integration Technologies Conference, September 17-20, 2012, Amsterdam, Netherlands. 2012. p. 1-4.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Effects of different temperature cycling test profiles on the reliability of UHF RFID tags

AU - Saarinen, Kirsi

AU - Frisk, Laura

N1 - Contribution: organisation=ele,FACT1=1

PY - 2012

Y1 - 2012

U2 - 10.1109/ESTC.2012.6542202

DO - 10.1109/ESTC.2012.6542202

M3 - Conference contribution

SN - 978-1-4673-4645-0

SP - 1

EP - 4

BT - ESTC 2012. 4th Electronics System Integration Technologies Conference, September 17-20, 2012, Amsterdam, Netherlands

ER -