Effects of thermal aging on the characteristic breakdown behavior of Nano-SiO2-BOPP and BOPP films

Mikael Ritamäki; Ilkka Rytöluoto; Kari Lahti; Mikko Karttunen

doi:10.1109/ICPADM.2015.7295293

Effects of thermal aging on the characteristic breakdown behavior of Nano-SiO2-BOPP and BOPP films

Mikael Ritamäki
, Ilkka Rytöluoto
, Kari Lahti
, Mikko Karttunen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

8 Citations (Scopus)

Original language	English
Title of host publication	2015 IEEE 11th International Conference on the Properties and Applications of Dielectric Materials (ICPADM)
Pages	400-403
Number of pages	4
ISBN (Electronic)	978-1-4799-8903-4
DOIs	https://doi.org/10.1109/ICPADM.2015.7295293
Publication status	Published - Jul 2015
Publication type	A4 Article in conference proceedings
Event	International Conference Properties and Applications of Dielectric Materials - , Australia Duration: 1 Jan 2015 → …

Conference

Conference	International Conference Properties and Applications of Dielectric Materials
Country/Territory	Australia
Period	1/01/15 → …

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No publication forum level

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10.1109/ICPADM.2015.7295293

High Voltage Laboratory
Lahti, K. (Contact)
Electrical Engineering
Facility/equipment: Research infrastructure

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@inproceedings{8a8d01c480884ef7847a4797dff92683,

title = "Effects of thermal aging on the characteristic breakdown behavior of Nano-SiO2-BOPP and BOPP films",

author = "Mikael Ritam{\"a}ki and Ilkka Ryt{\"o}luoto and Kari Lahti and Mikko Karttunen",

year = "2015",

month = jul,

doi = "10.1109/ICPADM.2015.7295293",

language = "English",

pages = "400--403",

booktitle = "2015 IEEE 11th International Conference on the Properties and Applications of Dielectric Materials (ICPADM)",

note = "International Conference Properties and Applications of Dielectric Materials ; Conference date: 01-01-2015",

}

Ritamäki, M, Rytöluoto, I , Lahti, K & Karttunen, M 2015, Effects of thermal aging on the characteristic breakdown behavior of Nano-SiO2-BOPP and BOPP films. in 2015 IEEE 11th International Conference on the Properties and Applications of Dielectric Materials (ICPADM). pp. 400-403, International Conference Properties and Applications of Dielectric Materials, Australia, 1/01/15. https://doi.org/10.1109/ICPADM.2015.7295293

Effects of thermal aging on the characteristic breakdown behavior of Nano-SiO2-BOPP and BOPP films. / Ritamäki, Mikael; Rytöluoto, Ilkka ; Lahti, Kari et al.
2015 IEEE 11th International Conference on the Properties and Applications of Dielectric Materials (ICPADM). 2015. p. 400-403.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Effects of thermal aging on the characteristic breakdown behavior of Nano-SiO2-BOPP and BOPP films

AU - Ritamäki, Mikael

AU - Rytöluoto, Ilkka

AU - Lahti, Kari

AU - Karttunen, Mikko

PY - 2015/7

Y1 - 2015/7

U2 - 10.1109/ICPADM.2015.7295293

DO - 10.1109/ICPADM.2015.7295293

M3 - Conference contribution

SP - 400

EP - 403

BT - 2015 IEEE 11th International Conference on the Properties and Applications of Dielectric Materials (ICPADM)

T2 - International Conference Properties and Applications of Dielectric Materials

Y2 - 1 January 2015

ER -

Effects of thermal aging on the characteristic breakdown behavior of Nano-SiO2-BOPP and BOPP films

Conference

Publication forum classification

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Equipment

High Voltage Laboratory

Cite this