Efficient Fourier shape descriptor for industrial defect images using wavelelts

I. Kunttu, L. Lepistö, A. Visa

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    Translated title of the contributionEfficient Fourier shape descriptor for industrial defect images using wavelelts
    Original languageEnglish
    Pages (from-to)3 p
    JournalOptical Engineering
    Volume44
    Issue number8
    Publication statusPublished - 2005
    Publication typeA1 Journal article-refereed

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