| Translated title of the contribution | Efficient Fourier shape descriptor for industrial defect images using wavelelts |
|---|---|
| Original language | English |
| Pages (from-to) | 3 p |
| Journal | Optical Engineering |
| Volume | 44 |
| Issue number | 8 |
| Publication status | Published - 2005 |
| Publication type | A1 Journal article-refereed |
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