Empirically detecting the hype cycle with the life cycle indicators: an exploratory analysis of three technologies

H. Järvenpää, S.J. Mäkinen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

34 Citations (Scopus)

Translated title of the contribution	Empirically detecting the hype cycle with the life cycle indicators: an exploratory analysis of three technologies
Original language	English
Title of host publication	The IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2008), 8 to 11 December, Singapore
Pages	12-16
DOIs	https://doi.org/10.1109/IEEM.2008.4737823
Publication status	Published - 2008
Publication type	A4 Article in conference proceedings

Publication forum classification

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title = "Empirically detecting the hype cycle with the life cycle indicators: an exploratory analysis of three technologies",

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doi = "10.1109/IEEM.2008.4737823",

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Empirically detecting the hype cycle with the life cycle indicators: an exploratory analysis of three technologies. / Järvenpää, H.; Mäkinen, S.J.
The IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2008), 8 to 11 December, Singapore. 2008. p. 12-16.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

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BT - The IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2008), 8 to 11 December, Singapore

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