Fault detection in stack filter circuits based on sample selection probabilities

  • I. Dhaou
  • , D. Akopian
  • , P. Kuosmanen
  • , J. Astola

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientific

    2 Citations (Scopus)
    Translated title of the contributionFault detection in stack filter circuits based on sample selection probabilities
    Original languageEnglish
    Title of host publicationProc. of ICIP'96 International Conference on Image Processing, September 1996, Lausanne, Switzerland
    PublisherIEEE
    Pages765-768
    Publication statusPublished - 1996
    Publication typeB3 Article in conference proceedings

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