Fault diagnosis in open automation environment; application to binary distillation process

P. Lautala, Y. Majanne, P. Häyhä, P. Airikka

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientific

    Translated title of the contributionFault diagnosis in open automation environment; application to binary distillation process
    Original languageEnglish
    Title of host publication13th world congress of IFAC, June 30-July 5, 1996, San Francisco, USA
    Place of PublicationSan Francisco, USA
    Pages91-97
    Publication statusPublished - 1996
    Publication typeB3 Non-refereed article in conference proceedings

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