High-accuracy method for sample positioning in tightly focused nonlinear reflectivity measurement systems for semiconductor saturable absorber mirrors

Lasse Orsila; Janne Hyyti; Antti Härkönen; Günter Steinmeyer; Mircea Guina

High-accuracy method for sample positioning in tightly focused nonlinear reflectivity measurement systems for semiconductor saturable absorber mirrors

Lasse Orsila
, Janne Hyyti
, Antti Härkönen
, Günter Steinmeyer
, Mircea Guina

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific

Translated title of the contribution	High-accuracy method for sample positioning in tightly focused nonlinear reflectivity measurement systems for semiconductor saturable absorber mirrors
Original language	English
Title of host publication	Optics and Photonics Days 2014, OPD2014 Proceedings, 20-22 May, 2014, Turku, Finland
Publisher	Finnish Optical Society
Pages	51-51
Number of pages	1
ISBN (Print)	978-952-12-3055-4
Publication status	Published - 2014
Publication type	B3 Article in conference proceedings
Event	Optics and Photonics Days - Duration: 1 Jan 2014 → …

Publication series

Name	Optics and Photonics Days

Conference

Conference	Optics and Photonics Days
Period	1/01/14 → …

Cite this

Orsila, L., Hyyti, J., Härkönen, A., Steinmeyer, G., & Guina, M. (2014). High-accuracy method for sample positioning in tightly focused nonlinear reflectivity measurement systems for semiconductor saturable absorber mirrors. In Optics and Photonics Days 2014, OPD2014 Proceedings, 20-22 May, 2014, Turku, Finland (pp. 51-51). (Optics and Photonics Days). Finnish Optical Society.

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author = "Lasse Orsila and Janne Hyyti and Antti H{\"a}rk{\"o}nen and G{\"u}nter Steinmeyer and Mircea Guina",

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year = "2014",

language = "English",

isbn = "978-952-12-3055-4",

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Orsila, L, Hyyti, J, Härkönen, A, Steinmeyer, G & Guina, M 2014, High-accuracy method for sample positioning in tightly focused nonlinear reflectivity measurement systems for semiconductor saturable absorber mirrors. in Optics and Photonics Days 2014, OPD2014 Proceedings, 20-22 May, 2014, Turku, Finland. Optics and Photonics Days, Finnish Optical Society, pp. 51-51, Optics and Photonics Days, 1/01/14.

High-accuracy method for sample positioning in tightly focused nonlinear reflectivity measurement systems for semiconductor saturable absorber mirrors. / Orsila, Lasse; Hyyti, Janne; Härkönen, Antti et al.
Optics and Photonics Days 2014, OPD2014 Proceedings, 20-22 May, 2014, Turku, Finland. Finnish Optical Society, 2014. p. 51-51 (Optics and Photonics Days).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific

TY - GEN

T1 - High-accuracy method for sample positioning in tightly focused nonlinear reflectivity measurement systems for semiconductor saturable absorber mirrors

AU - Orsila, Lasse

AU - Hyyti, Janne

AU - Härkönen, Antti

AU - Steinmeyer, Günter

AU - Guina, Mircea

N1 - Contribution: organisation=orc,FACT1=1<br/>Portfolio EDEND: 2014-10-24<br/>Publisher name: Finnish Optical Society

PY - 2014

Y1 - 2014

M3 - Conference contribution

SN - 978-952-12-3055-4

T3 - Optics and Photonics Days

SP - 51

EP - 51

BT - Optics and Photonics Days 2014, OPD2014 Proceedings, 20-22 May, 2014, Turku, Finland

PB - Finnish Optical Society

T2 - Optics and Photonics Days

Y2 - 1 January 2014

ER -