High Temperature and Ageing Test Methods to Characterize the Dielectric Properties of BOPP Capacitor Films

Mikael Ritamäki; Ilkka Rytöluoto; Kari Lahti

High Temperature and Ageing Test Methods to Characterize the Dielectric Properties of BOPP Capacitor Films

Mikael Ritamäki, Ilkka Rytöluoto, Kari Lahti

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

5 Citations (Scopus)

188 Downloads (Pure)

Abstract

A large-area high temperature breakdown measurement and an ageing test method are presented. These methods facilitate the development of reliable higher energy density film capacitors by exploiting large measurement areas to provide information on weak point formation and subtle changes in breakdown behavior after electro-thermal or thermal ageing. The test methods were used to characterize two types of highly isotactic biaxially oriented polypropylene capacitor films, which had similar breakdown behavior at room temperature, but different breakdown properties at high temperature and out of which one was more susceptible to electro-thermal DC ageing.

Original language	English
Title of host publication	2017 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
Publisher	IEEE
Pages	266-269
Number of pages	4
ISBN (Electronic)	978-1-5386-1194-4
Publication status	Published - 2017
Publication type	A4 Article in conference proceedings
Event	IEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA - Duration: 1 Jan 1900 → …

Conference

Conference	IEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA
Period	1/01/00 → …

Publication forum classification

Publication forum level 1

Access to Document

CEIDP-2017-Ritamaki
© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Accepted author manuscript, 650 KB

http://urn.fi/URN:NBN:fi:tty-201808292236

High Voltage Laboratory
Lahti, K. (Contact)
Electrical Engineering
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Cite this

@inproceedings{ba64a9ceedfa41fab64f22f930735193,

title = "High Temperature and Ageing Test Methods to Characterize the Dielectric Properties of BOPP Capacitor Films",

abstract = "A large-area high temperature breakdown measurement and an ageing test method are presented. These methods facilitate the development of reliable higher energy density film capacitors by exploiting large measurement areas to provide information on weak point formation and subtle changes in breakdown behavior after electro-thermal or thermal ageing. The test methods were used to characterize two types of highly isotactic biaxially oriented polypropylene capacitor films, which had similar breakdown behavior at room temperature, but different breakdown properties at high temperature and out of which one was more susceptible to electro-thermal DC ageing.",

author = "Mikael Ritam{\"a}ki and Ilkka Ryt{\"o}luoto and Kari Lahti",

year = "2017",

language = "English",

pages = "266--269",

booktitle = "2017 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)",

publisher = "IEEE",

address = "United States",

note = "IEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA ; Conference date: 01-01-1900",

}

Ritamäki, M, Rytöluoto, I & Lahti, K 2017, High Temperature and Ageing Test Methods to Characterize the Dielectric Properties of BOPP Capacitor Films. in 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP). IEEE, pp. 266-269, IEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA, 1/01/00. <http://urn.fi/URN:NBN:fi:tty-201808292236>

High Temperature and Ageing Test Methods to Characterize the Dielectric Properties of BOPP Capacitor Films. / Ritamäki, Mikael; Rytöluoto, Ilkka ; Lahti, Kari.
2017 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP). IEEE, 2017. p. 266-269.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - High Temperature and Ageing Test Methods to Characterize the Dielectric Properties of BOPP Capacitor Films

AU - Ritamäki, Mikael

AU - Rytöluoto, Ilkka

AU - Lahti, Kari

PY - 2017

Y1 - 2017

N2 - A large-area high temperature breakdown measurement and an ageing test method are presented. These methods facilitate the development of reliable higher energy density film capacitors by exploiting large measurement areas to provide information on weak point formation and subtle changes in breakdown behavior after electro-thermal or thermal ageing. The test methods were used to characterize two types of highly isotactic biaxially oriented polypropylene capacitor films, which had similar breakdown behavior at room temperature, but different breakdown properties at high temperature and out of which one was more susceptible to electro-thermal DC ageing.

AB - A large-area high temperature breakdown measurement and an ageing test method are presented. These methods facilitate the development of reliable higher energy density film capacitors by exploiting large measurement areas to provide information on weak point formation and subtle changes in breakdown behavior after electro-thermal or thermal ageing. The test methods were used to characterize two types of highly isotactic biaxially oriented polypropylene capacitor films, which had similar breakdown behavior at room temperature, but different breakdown properties at high temperature and out of which one was more susceptible to electro-thermal DC ageing.

M3 - Conference contribution

SP - 266

EP - 269

BT - 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

PB - IEEE

T2 - IEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA

Y2 - 1 January 1900

ER -

High Temperature and Ageing Test Methods to Characterize the Dielectric Properties of BOPP Capacitor Films

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