TY - GEN
T1 - Improved Sensitivity of No-Reference Image Visual Quality Metrics to the Presence of Noise
AU - Bahnemiri, Sheyda Ghanbaralizadeh
AU - Ponomarenko, Mykola
AU - Egiazarian, Karen
N1 - Publisher Copyright:
© 2023, The Author(s), under exclusive license to Springer Nature Switzerland AG.
PY - 2023
Y1 - 2023
N2 - A problem of no-reference image visual quality assessment when images are corrupted by noise is considered in this paper. A specialized image set is proposed for the following two tasks: automatic verification of sensitivity of no-reference image visual quality metrics to noise, and analysis of blind noise level estimation methods. As a result, a method to improve the sensitivity of a given no reference quality metric to the presence of noise is proposed by combining this metric with a noise level estimator. The proposed method allows to significantly decrease a probability of wrong quality predictions for noisy images. Efficiency of usage of different noise level estimators in the proposed combined metrics is analyzed.
AB - A problem of no-reference image visual quality assessment when images are corrupted by noise is considered in this paper. A specialized image set is proposed for the following two tasks: automatic verification of sensitivity of no-reference image visual quality metrics to noise, and analysis of blind noise level estimation methods. As a result, a method to improve the sensitivity of a given no reference quality metric to the presence of noise is proposed by combining this metric with a noise level estimator. The proposed method allows to significantly decrease a probability of wrong quality predictions for noisy images. Efficiency of usage of different noise level estimators in the proposed combined metrics is analyzed.
KW - Blind noise level estimation
KW - Deep neural networks
KW - Image visual quality assessment
KW - No-reference image quality metrics
U2 - 10.1007/978-3-031-31435-3_14
DO - 10.1007/978-3-031-31435-3_14
M3 - Conference contribution
AN - SCOPUS:85161375798
SN - 978-3-031-31434-6
T3 - Lecture Notes in Computer Science
SP - 201
EP - 214
BT - Image Analysis - 23rd Scandinavian Conference, SCIA 2023, Proceedings
A2 - Gade, Rikke
A2 - Felsberg, Michael
A2 - Kämäräinen, Joni-Kristian
PB - Springer
T2 - Scandinavian Conference on Image Analysis
Y2 - 18 April 2023 through 21 April 2023
ER -