In-situ RHEED studies to understand the dislocation formation process in growth of InGaAs on GaAs

P.R. Berger, K.H. Chang, P. Bhattacharya, J. Singh, K.K. Bajaj

Research output: Contribution to journalConference articleScientificpeer-review

Original languageUndefined/Unknown
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume0944
DOIs
Publication statusPublished - 1988
Externally publishedYes
Publication typeA1 Journal article-refereed

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