| Original language | Undefined/Unknown |
|---|---|
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 0944 |
| DOIs | |
| Publication status | Published - 1988 |
| Externally published | Yes |
| Publication type | A1 Journal article-refereed |
In-situ RHEED studies to understand the dislocation formation process in growth of InGaAs on GaAs
P.R. Berger, K.H. Chang, P. Bhattacharya, J. Singh, K.K. Bajaj
Research output: Contribution to journal › Conference article › Scientific › peer-review