Instrumentation and analytical methods of an x-ray photoelectron spectroscopy-scanning tunneling microscopy surface analysis system for studying nanostructured materials

K. Lahtonen, M. Lampimäki, P. Jussila, M. Hirsimäki, M. Valden

    Research output: Contribution to journalArticleScientificpeer-review

    34 Citations (Scopus)
    Translated title of the contributionInstrumentation and analytical methods of an x-ray photoelectron spectroscopy-scanning tunneling microscopy surface analysis system for studying nanostructured materials
    Original languageEnglish
    Pages (from-to)9 p
    JournalReview of Scientific Instruments
    Volume77
    Issue number1
    DOIs
    Publication statusPublished - 2006
    Publication typeA1 Journal article-refereed

    Publication forum classification

    • No publication forum level

    Cite this