Translated title of the contribution | IR-based system for short-circuit detection during copper electrorefining process |
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Original language | English |
Title of host publication | Machine Vision Applications in Industrial Inpection VII, 25-26 January 1999, San Jose, CA. Proceedings of SPIE |
Editors | K.W. Tobin, N.S. Chang |
Pages | 2-9 |
Publication status | Published - 1999 |
Publication type | B3 Article in conference proceedings |
Publication forum classification
- No publication forum level