IR-based system for short-circuit detection during copper electrorefining process

E. Mäkipää, J.T. Tanttu, H. Virtanen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientific

    10 Citations (Scopus)
    Translated title of the contributionIR-based system for short-circuit detection during copper electrorefining process
    Original languageEnglish
    Title of host publicationMachine Vision Applications in Industrial Inpection VII, 25-26 January 1999, San Jose, CA. Proceedings of SPIE
    EditorsK.W. Tobin, N.S. Chang
    Pages2-9
    Publication statusPublished - 1999
    Publication typeB3 Article in conference proceedings

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