IR-based system for short-circuit detection during copper electrorefining process

E. Mäkipää, J.T. Tanttu, H. Virtanen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific

11 Citations (Scopus)

Translated title of the contribution	IR-based system for short-circuit detection during copper electrorefining process
Original language	English
Title of host publication	Machine Vision Applications in Industrial Inpection VII, 25-26 January 1999, San Jose, CA. Proceedings of SPIE
Editors	K.W. Tobin, N.S. Chang
Pages	2-9
Publication status	Published - 1999
Publication type	B3 Article in conference proceedings

Publication forum classification

@inproceedings{200d3d1731bb4a8ca35edbbc7d393c0b,

title = "IR-based system for short-circuit detection during copper electrorefining process",

author = "E. M{\"a}kip{\"a}{\"a} and J.T. Tanttu and H. Virtanen",

note = "Contribution: organisation=pori ttp,FACT1=1",

year = "1999",

language = "English",

pages = "2--9",

editor = "K.W. Tobin and N.S. Chang",

booktitle = "Machine Vision Applications in Industrial Inpection VII, 25-26 January 1999, San Jose, CA. Proceedings of SPIE",

}

IR-based system for short-circuit detection during copper electrorefining process. / Mäkipää, E.; Tanttu, J.T.; Virtanen, H.
Machine Vision Applications in Industrial Inpection VII, 25-26 January 1999, San Jose, CA. Proceedings of SPIE. ed. / K.W. Tobin; N.S. Chang. 1999. p. 2-9.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific

TY - GEN

T1 - IR-based system for short-circuit detection during copper electrorefining process

AU - Mäkipää, E.

AU - Tanttu, J.T.

AU - Virtanen, H.

N1 - Contribution: organisation=pori ttp,FACT1=1

PY - 1999

Y1 - 1999

M3 - Conference contribution

SP - 2

EP - 9

BT - Machine Vision Applications in Industrial Inpection VII, 25-26 January 1999, San Jose, CA. Proceedings of SPIE

A2 - Tobin, K.W.

A2 - Chang, N.S.

ER -