Abstract
A multi-breakdown measurement method for large-area dielectric breakdown characterization of polymer films is presented and evaluated. Based on the self-healing breakdown capability of metalized film, large amount of breakdown data can be obtained from a relatively large total film area, thus enabling the execution of detailed breakdown performance analysis. The studied films include non-metalized laboratoryscale, pilot-scale and commercial capacitor-grade bi-axially oriented polypropylene films in the thickness range of 14-25 μm. With the active measurement area of 81 cm<sup>2</sup> per sample, breakdown distributions covering total film areas of 486-972 cm<sup>2</sup> are presented. Various aspects encompassing the sample film preparation, measurement procedure, breakdown progression, discharge event characterization, breakdown field determination, data validation and statistical analysis are discussed. Comparative small-area breakdown measurements were performed in order to study the relationship between the large-area multi-breakdown measurement method and a conventional small-area (1 cm<sup>2</sup>) manual breakdown measurement method. Implications of the areadependence and the applicability of the Weibull area-scaling are also discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 689-700 |
| Number of pages | 12 |
| Journal | IEEE Transactions on Dielectrics and Electrical Insulation |
| Volume | 22 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 1 Apr 2015 |
| Publication type | A1 Journal article-refereed |
Keywords
- area-dependence
- Dielectric breakdown
- large-area breakdown performance
- self-healing
- statistical analysis
- Weibull distribution
Publication forum classification
- Publication forum level 2
ASJC Scopus subject areas
- Electrical and Electronic Engineering
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Lahti, K. (Contact)
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