Learning to Count with Back-Propagated Information

Ke Chen; Joni-Kristian Kämäräinen

doi:10.1109/ICPR.2014.799

Learning to Count with Back-Propagated Information

Ke Chen
, Joni-Kristian Kämäräinen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

18 Citations (Scopus)

Translated title of the contribution	Learning to Count with Back-Propagated Information
Original language	English
Title of host publication	22nd International Conference on Pattern Recognition, ICPR 2014, August 24-28 2014, Stockholm, Sweden
Place of Publication	Piscataway
Publisher	IEEE
Pages	4672-4677
Number of pages	6
ISBN (Print)	978-1-4244-2174-9
DOIs	https://doi.org/10.1109/ICPR.2014.799
Publication status	Published - 2014
Publication type	A4 Article in conference proceedings
Event	International Conference on Pattern Recognition - Duration: 1 Jan 1900 → …

Conference

Conference	International Conference on Pattern Recognition
Period	1/01/00 → …

Publication forum classification

Publication forum level 1

Access to Document

10.1109/ICPR.2014.799

Cite this

@inproceedings{11980d6d75a544e08b329528c3e4c729,

title = "Learning to Count with Back-Propagated Information",

author = "Ke Chen and Joni-Kristian K{\"a}m{\"a}r{\"a}inen",

note = "Contribution: organisation=sgn,FACT1=1<br/>Portfolio EDEND: 2014-12-10; International Conference on Pattern Recognition ; Conference date: 01-01-1900",

year = "2014",

doi = "10.1109/ICPR.2014.799",

language = "English",

isbn = "978-1-4244-2174-9",

pages = "4672--4677",

booktitle = "22nd International Conference on Pattern Recognition, ICPR 2014, August 24-28 2014, Stockholm, Sweden",

publisher = "IEEE",

address = "United States",

}

TY - GEN

T1 - Learning to Count with Back-Propagated Information

AU - Chen, Ke

AU - Kämäräinen, Joni-Kristian

N1 - Contribution: organisation=sgn,FACT1=1<br/>Portfolio EDEND: 2014-12-10

PY - 2014

Y1 - 2014

U2 - 10.1109/ICPR.2014.799

DO - 10.1109/ICPR.2014.799

M3 - Conference contribution

SN - 978-1-4244-2174-9

SP - 4672

EP - 4677

BT - 22nd International Conference on Pattern Recognition, ICPR 2014, August 24-28 2014, Stockholm, Sweden

PB - IEEE

CY - Piscataway

T2 - International Conference on Pattern Recognition

Y2 - 1 January 1900

ER -