Least-squares technique to determine the second-order nonlinearity of thin films of low symmetry

M. Siltanen, S. Cattaneo, L. Ylinen, M. Kauranen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific

Translated title of the contribution	Least-squares technique to determine the second-order nonlinearity of thin films of low symmetry
Original language	English
Title of host publication	Conference on Lasers and Electro-Optics 2003, June 1-6, 2003, Maryland, USA
Place of Publication	USA
Pages	2 s
Publication status	Published - 2003
Publication type	B3 Article in conference proceedings

Publication forum classification

@inproceedings{e120d142c00d4188821d10fc64051cdb,

title = "Least-squares technique to determine the second-order nonlinearity of thin films of low symmetry",

author = "M. Siltanen and S. Cattaneo and L. Ylinen and M. Kauranen",

note = "ISBN 1-55752-733-4, CD-rom<br/>Contribution: organisation=fys,FACT1=1",

year = "2003",

language = "English",

pages = "2 s",

booktitle = "Conference on Lasers and Electro-Optics 2003, June 1-6, 2003, Maryland, USA",

}

TY - GEN

T1 - Least-squares technique to determine the second-order nonlinearity of thin films of low symmetry

AU - Siltanen, M.

AU - Cattaneo, S.

AU - Ylinen, L.

AU - Kauranen, M.

N1 - ISBN 1-55752-733-4, CD-rom<br/>Contribution: organisation=fys,FACT1=1

PY - 2003

Y1 - 2003

M3 - Conference contribution

SP - 2 s

BT - Conference on Lasers and Electro-Optics 2003, June 1-6, 2003, Maryland, USA

CY - USA

ER -