Line defects in two-dimensional four-beam interference patterns

C. Tan; C.S. Peng; V.N. Petryakov; Yu.K. Verevkin; J. Zhang; Z. Wang; S.M. Olaizola; T. Berthou; S. Tisserand; M. Pessa

doi:10.1088/1367-2630/10/2/023023

Line defects in two-dimensional four-beam interference patterns

C. Tan
, C.S. Peng
, V.N. Petryakov
, Yu.K. Verevkin
, J. Zhang
, Z. Wang
, S.M. Olaizola
, T. Berthou
, S. Tisserand
, M. Pessa

Research output: Contribution to journal › Article › Scientific › peer-review

20 Citations (Scopus)

Translated title of the contribution	Line defects in two-dimensional four-beam interference patterns
Original language	English
Pages (from-to)	8 p
Journal	New Journal of Physics
Issue number	023023
DOIs	https://doi.org/10.1088/1367-2630/10/2/023023
Publication status	Published - 2008
Publication type	A1 Journal article-refereed

Publication forum classification

Publication forum level 2

Access to Document

10.1088/1367-2630/10/2/023023

Cite this

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title = "Line defects in two-dimensional four-beam interference patterns",

author = "C. Tan and C.S. Peng and V.N. Petryakov and Yu.K. Verevkin and J. Zhang and Z. Wang and S.M. Olaizola and T. Berthou and S. Tisserand and M. Pessa",

note = "Contribution: organisation=orc,FACT1=1",

year = "2008",

doi = "10.1088/1367-2630/10/2/023023",

language = "English",

pages = "8 p",

journal = "New Journal of Physics",

issn = "1367-2630",

publisher = "Institute of Physics",

number = "023023",

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TY - JOUR

T1 - Line defects in two-dimensional four-beam interference patterns

AU - Tan, C.

AU - Peng, C.S.

AU - Petryakov, V.N.

AU - Verevkin, Yu.K.

AU - Zhang, J.

AU - Wang, Z.

AU - Olaizola, S.M.

AU - Berthou, T.

AU - Tisserand, S.

AU - Pessa, M.

N1 - Contribution: organisation=orc,FACT1=1

PY - 2008

Y1 - 2008

U2 - 10.1088/1367-2630/10/2/023023

DO - 10.1088/1367-2630/10/2/023023

M3 - Article

SN - 1367-2630

SP - 8 p

JO - New Journal of Physics

JF - New Journal of Physics

IS - 023023

ER -