Local transform-based denoising for radar image prosessing

K. Egiazarian; V. Melnik; V. Lukin; J. Astola

Local transform-based denoising for radar image prosessing

K. Egiazarian, V. Melnik, V. Lukin, J. Astola

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

Translated title of the contribution	Local transform-based denoising for radar image prosessing
Original language	English
Title of host publication	Nonlinear Image Processing and Pattern Analysis XII, Proceedings of SPIE, The International Society for Optical Engineering, 22 - 23 January, 2001 San Jose, USA
Editors	E. R. Dougherty, J. Astola
Pages	170-178
Publication status	Published - 2001
Publication type	A4 Article in conference proceedings

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Cite this

@inproceedings{b9a5c9c6b31d4cc0903be497aa900d5c,

title = "Local transform-based denoising for radar image prosessing",

author = "K. Egiazarian and V. Melnik and V. Lukin and J. Astola",

note = "Contribution: organisation=sgn,FACT1=1",

year = "2001",

language = "English",

pages = "170--178",

editor = "Dougherty, {E. R.} and J. Astola",

booktitle = "Nonlinear Image Processing and Pattern Analysis XII, Proceedings of SPIE, The International Society for Optical Engineering, 22 - 23 January, 2001 San Jose, USA",

}

Local transform-based denoising for radar image prosessing. / Egiazarian, K.; Melnik, V.; Lukin, V. et al.
Nonlinear Image Processing and Pattern Analysis XII, Proceedings of SPIE, The International Society for Optical Engineering, 22 - 23 January, 2001 San Jose, USA. ed. / E. R. Dougherty; J. Astola. 2001. p. 170-178.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Local transform-based denoising for radar image prosessing

AU - Egiazarian, K.

AU - Melnik, V.

AU - Lukin, V.

AU - Astola, J.

N1 - Contribution: organisation=sgn,FACT1=1

PY - 2001

Y1 - 2001

M3 - Conference contribution

SP - 170

EP - 178

BT - Nonlinear Image Processing and Pattern Analysis XII, Proceedings of SPIE, The International Society for Optical Engineering, 22 - 23 January, 2001 San Jose, USA

A2 - Dougherty, E. R.

A2 - Astola, J.

ER -