@inproceedings{ae408775f6bb41fba05147a263cb96c3,
title = "Measuring Resistive Characteristics of Silicon Nanowire by Applying Electrostatic Tensile Device and Broadband Test Signal",
author = "T. Roinila and H. Zeng and J. Verho and X. Yu and M. Vilkko and P. Kallio and J. Lekkala and T. Li and Y. Wang",
note = "Contribution: organisation=ase,FACT1=1<br/>Portfolio EDEND: 2013-10-29",
year = "2013",
language = "English",
isbn = "978-1-4822-0581-7",
series = "Nanotechnology Conference and Expo",
publisher = "Nano Science and Technology Institute",
pages = "23--26",
booktitle = "Nanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites Nanotech, Conference & Expo 2013, May 12-16, 2013 Washington, DC",
}