Measuring Resistive Characteristics of Silicon Nanowire by Applying Electrostatic Tensile Device and Broadband Test Signal

T. Roinila, H. Zeng, J. Verho, X. Yu, M. Vilkko, P. Kallio, J. Lekkala, T. Li, Y. Wang

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Translated title of the contributionMeasuring Resistive Characteristics of Silicon Nanowire by Applying Electrostatic Tensile Device and Broadband Test Signal
    Original languageEnglish
    Title of host publicationNanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites Nanotech, Conference & Expo 2013, May 12-16, 2013 Washington, DC
    PublisherNano Science and Technology Institute
    Pages23-26
    Number of pages4
    ISBN (Print)978-1-4822-0581-7
    Publication statusPublished - 2013
    Publication typeA4 Article in conference proceedings

    Publication series

    NameNanotechnology Conference and Expo
    PublisherNano Science and Technology Institute
    Volume1

    Publication forum classification

    • No publication forum level

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