| Translated title of the contribution | Menetelmä hiukkasjakauman ominaisuuksien mittaamiseksi |
|---|---|
| Original language | Finnish |
| Patent number | Pat. FI 115074 B |
| Priority date | 28/02/05 |
| Publication status | Published - 2005 |
| Publication type | H1 Granted patent |
Publication forum classification
- No publication forum level
Research output
- 1 Patent
-
Method for measuring properties of a particle distribution
Keskinen, J. (Inventor), Marjamäki, M. (Inventor), Moisio, M. (Inventor), Ristimäki, J. (Inventor) & Virtanen, A. (Inventor), 2006, Patent No. Pat. US 7066037 (B2), Priority date 27 Jun 2006, Priority No. (21) 10/487264 (30) 20011668Research output: Patent
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