@inproceedings{fc3790235dba4f068b50bc9fbfe8e709,
title = "Metal-semiconductor-metal photodetectors",
keywords = "Bandwidth, External quantum efficiency, Field effect transistor, Metal-semiconductor-metal (MSM), Photodetector, Photodiodes, Responsivity, Schottky barrier height, Transparent conductor",
author = "Berger, {P. R.}",
note = "Copyright: Copyright 2005 Elsevier Science B.V., Amsterdam. All rights reserved.; Testing, Reliability, and Applications of Optoelectronic Devices ; Conference date: 24-01-2001 Through 26-01-2001",
year = "2001",
doi = "10.1117/12.426888",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
pages = "198--207",
booktitle = "Testing, Reliability, and Applications of Optoelectronic Devices",
address = "United States",
}