Method for measuring properties of a particle distribution

J. Keskinen; M. Marjamäki; M. Moisio; J. Ristimäki; A. Virtanen

Method for measuring properties of a particle distribution

J. Keskinen (Inventor), M. Marjamäki (Inventor), M. Moisio (Inventor), J. Ristimäki (Inventor), A. Virtanen (Inventor)

Research output: Patent

Translated title of the contribution	Method for measuring properties of a particle distribution
Original language	English
Patent number	Pat. US 7066037 (B2)
Priority date	27/06/06
Publication status	Published - 2006
Publication type	H1 Granted patent

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Cite this

@misc{b12748b6ac7d4a569e85a8d308609916,

title = "Method for measuring properties of a particle distribution",

author = "J. Keskinen and M. Marjam{\"a}ki and M. Moisio and J. Ristim{\"a}ki and A. Virtanen",

note = "Tilastoitu v. 2005 samasta patenttiperheest{\"a} patentti FI 115074, ei tilastoida<br/>Contribution: organisation=fys,FACT1=1; Pat. US 7066037 (B2)",

year = "2006",

language = "English",

type = "Patent",

}